EECS 579 - Digital Systems Testing
Section: 001
Term: WN 2018
Subject: Electrical Engineering and Computer Science (EECS)
Department: CoE Electrical Engineering and Computer Science
Credits:
4
Requirements & Distribution:
BS
Advisory Prerequisites:
Graduate standing.
Other Course Info:
F.
BS:
This course counts toward the 60 credits of math/science required for a Bachelor of Science degree.
Repeatability:
May not be repeated for credit.
Primary Instructor:

Overview of fault-tolerant computing. Fault sources and models. Testing process. Combinational circuit testing. D-Algorithm and PODEM. Sequential circuit testing. Checking experiments. RAM and microprocessor testing. Fault simulation. Design for testability. Testability measures. Self-testing circuits and systems.

EECS 579 - Digital Systems Testing
Schedule Listing
001 (LEC)
 
32200
Open
10
 
-
MW 9:00AM - 10:30AM
011 (DIS)
P
32201
Open
10
 
-
Tu 2:00PM - 3:00PM
NOTE: Data maintained by department in Wolverine Access. If no textbooks are listed below, check with the department.


ISBN: 0792379918
Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits, Author: Michael L. Bushnell; Vishwani D. Agrawal., Publisher: Kluwer Acad. Publ. 2. print. 2001
Required
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